Certification

• IEC61215:2021 / IEC61730:2023 · 

• IEC61701 / IEC62716 / IEC60068 / IEC62804 ·

•  ISO9001:2015: Quality Management System ·

•  ISO14001:2015: Environment Management System ·

•  ISO45001:2018: Occupational health and safety management systems.

Features

• N-type modules with Tunnel Oxide Passivating Contacts (TOPcon) technology offer lower LID/LeTID degradation and better low light performance.

• N-type modules with Solar's HOT 3.0 technology offer better reliability and efficiency.

• High salt mist and ammonia resistance.

• Certified to withstand: 5400 Pa front side max static test load 2400 Pa rear side max static test load.

• Better light trapping and current collection to improve module power output and reliability.

• Minimizes the chance of degradation caused by PID phenomena through optimization of cell production technology and material control.

Mechanical Characteristics

Packaging Configuration

Specifications (STC)

Application Conditions

Engineering Drawings

*Note: For specific dimensions and tolerance ranges, please refer to the corresponding detailed module drawings.

Electrical Performance & Temperature Dependence

What is the LID/LeTID phenomenon?

LID (Light Induced Degradation) and LeTID (Light and Elevated Temperature Induced Degradation) are two phenomena that affect the performance of solar cells. Especially in high-power output modules, these issues are particularly important. The following is an explanation of the LID and LeTID phenomena and their impact on 610-635 watt single-sided modules.

• LID：LID refers to the performance degradation phenomenon that occurs when solar cells are exposed to sunlight for the first time. This phenomenon is mainly due to the formation of boron-oxygen complexes in the battery material (usually p-type monocrystalline silicon) under illumination, resulting in a reduction in the efficiency of the battery.

• LeTID：LeTID is another performance degradation phenomenon. It occurs when the battery operates under high temperature (for example, above 70 °C) and illumination conditions. The performance degradation caused by LeTID is more serious than that of LID, and the recovery speed is slower.